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Optical and Electrical Studies of Vertically Oriented Tellurium Nanowire Arrays Produced by Template Electrodeposition

机译:模板电沉积制备垂直取向碲纳米线阵列的光学和电学研究

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摘要

We report the fabrication of highly ordered arrays of tellurium nanowires and investigate their electrical, optical and structural properties. The tellurium nanowire arrays were synthesized by electrochemical deposition via a template method and characterized by x-ray diffraction (XRD), field emission scanning electron microscopy (FESEM) and UV-Visible spectroscopy. The XRD and FESEM characterizations confirm the formation of a dense crop of tellurium nanowire arrays with hexagonal phase. The intense crystalline peak corresponding to the (100) plane observed in the XRD spectra suggests a preferential growth of wires along the [001] direction. The crystallite size and micro-strain effect were estimated by Williamson-Hall (WH) analysis. The average crystallite size and lattice strain extracted from WH plot were found to be similar to 34 nm and 0.0044, respectively. Further, electrical properties of the arrays of nanowires were examined using a two-probe method. The current-voltage curve of the tellurium wires exhibits a non-linear behavior and a double diode-like characteristic, which signifies their novel applications in future nanodevices.
机译:我们报告了碲纳米线的高度有序阵列的制造,并研究了它们的电,光学和结构特性。碲纳米线阵列是通过模板方法通过电化学沉积合成的,并通过X射线衍射(XRD),场发射扫描电子显微镜(FESEM)和紫外可见光谱进行了表征。 XRD和FESEM表征证实了六方相碲纳米线阵列致密的形成。在XRD光谱中观察到的与(100)平面相对应的强烈结晶峰表明,线沿[001]方向优先生长。通过Williamson-Hall(WH)分析估计微晶尺寸和微应变效应。从WH图中提取的平均微晶尺寸和晶格应变分别类似于34 nm和0.0044。此外,使用双探针方法检查了纳米线阵列的电性能。碲线的电流-电压曲线表现出非线性行为和类似二极管的双重特性,这表明它们在未来的纳米器件中的新颖应用。

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