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Incidental trends and the power of panel unit root tests

机译:偶然趋势和面板单元根测试的功能

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摘要

The asymptotic local power of various panel unit root tests is investigated. The (Gaussian) power envelope is obtained under homogeneous and heterogeneous alternatives. The envelope is compared with the asymptotic power functions for the pooled t-test, the Ploberger and Phillips [2002. Optimal testing for unit roots in panel data. Mimeo] test, and a point optimal test in neighborhoods of unity that are of order n~(-1/4)T~(-1)and n~(-1/2)T~(-1), depending on whether or not incidental trends are extracted from the panel data. In the latter case, when the alternative hypothesis is homogeneous across individuals, it is shown that the point optimal test and the Ploberger-Phillips test both achieve the power envelope and are uniformly most powerful, in contrast to point optimal unit root tests for time series. Some simulations examining the finite sample performance of the tests are reported.
机译:研究了各种面板单元根检验的渐近局部幂。 (高斯)功率包络是在同质和异质替代方案下获得的。将包络与集合t检验的渐近幂函数进行比较,Ploberger和Phillips [2002年。面板数据中单位根的最佳测试。 Mimeo]测试,以及根据是否是否满足n〜(-1/4)T〜(-1)和n〜(-1/2)T〜(-1)的单位邻域的点最优测试是否从面板数据中提取偶然趋势。在后一种情况下,当备选假设在各个个体之间是同质的时,表明与时间序列的点最优单位根检验相比,点最优检验和Ploberger-Phillips检验都达到了功率包络并且功率最均匀。 。报告了一些模拟测试的有限样本性能。

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