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Kinetics, FTIR, and Controlled Atmosphere EXAFS Study of the Effect of Chlorine on Pt-Supported Catalysts during Oxidation Reactions

机译:动力学,FTIR和可控气氛EXAFS研究氯对Pt负载的催化剂氧化反应的影响

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The poisoning effect of Cl on the activity of Pt-supported catalysts for CO, methane, and ethane oxidation has been investigated by kinetic studies and in situ IR and controlled atmosphere EXAFS spectroscopies. Catalysts containing 1.5% Pt/Al_2O_3 were prepared by incipient wetness from H_2PtCl_6 and Pt(NH_3)_4(NO_3)_2 precursors. The reduced catalysts have similar dispersion (0.8) as estimated by H_2 chemisorption. The Cl-free catalyst was 10 times more active than the Cl-containing catalyst during CO and ethane oxidation. ddition of HCl to the Cl-free catalyst rendered its activity identical to the catalyst prepared from Cl-containing precursors. The presence of Cl also affects the activity of 2% Pt/SiO_2 catalysts, but to a lower extent. On the Cl-free oxidation catalyst, Pt-Pt and Pt-O bonds were detected using EXAFS, suggesting that the reduced metal particles are not fully oxidized under the reaction conditions. Additionally, chemisorption of CO by the oxidized catalyst indicates that a portion of the reduced Pt atoms is exposed to the reactants. On the Cl-containing catalyst, there are also Pt-Cl as well as Pt-Pt and Pt-O bonds. The later catalyst, however, does not chemisorb CO, indicating that there are no reduced surface Pt supported on silica is similar to that on alumina. IR results show that chlorine significantly reduces the amount of CO adsorbed on metallic Pt sites. At low temperature there is little CO adsorbed on the Cl-containing Pt/silica catalyst, while at higher temperature the amount of adsorbed CO increases, likely due to reduction of the oxidized surface. The catalyst activities correlate well with the amount of reduced surface sites, and a model is proposed to exposed to explain the mechanism of chloride poisoning, which is shown to occur mainly by site blocking.
机译:通过动力学研究,原位红外和受控气氛EXAFS光谱研究了Cl对Pt负载的催化剂对CO,甲烷和乙烷氧化活性的中毒作用。通过初湿从H_2PtCl_6和Pt(NH_3)_4(NO_3)_2前体制备含1.5%Pt / Al_2O_3的催化剂。还原的催化剂具有通过H_2化学吸附估计的相似的分散度(0.8)。在CO和乙烷氧化过程中,不含Cl的催化剂的活性比含Cl的催化剂高10倍。 HCl到无氯催化剂的加入使其活性与由含氯前体制备的催化剂相同。 Cl的存在也会影响2%Pt / SiO_2催化剂的活性,但程度较低。在不含氯的氧化催化剂上,使用EXAFS检测到Pt-Pt和Pt-O键,这表明还原金属颗粒在反应条件下并未完全氧化。另外,氧化的催化剂对CO的化学吸附表明一部分还原的Pt原子暴露于反应物。在含氯催化剂上,还存在Pt-Cl以及Pt-Pt和Pt-O键。然而,后面的催化剂不能化学吸附CO,表明没有负载在二氧化硅上的还原的表面Pt类似于氧化铝上的还原表面。红外结果表明,氯显着降低了金属Pt部位吸附的CO量。在低温下,几乎没有CO吸附在含Cl的Pt /二氧化硅催化剂上,而在高温下,吸附的CO量增加,这可能是由于氧化表面的减少所致。催化剂的活性与减少的表面位点的数量有很好的相关性,并提出了一个模型来解释氯离子中毒的机理,该机理主要是由于位点阻断而引起的。

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