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Structure of adsorbed layers of nitrophenoxy-tailed quaternary ammonium surfactants at the air/water interface studied by neutron reflection

机译:中子反射法研究硝基苯氧基尾季铵表面活性剂在空气/水界面的吸附层结构

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The adsorbed layers of N,N,N-trimethyl-10-(4-nitrophenoxy)decylammonium bromide (Phi C(10)TAB) and N,N,N',N'-tetramethyl-N,N'-bis[10-(4-nitrophenoxy)decyl]-1,6-hexanediammonium dibromide [(Phi C-10)(2)-C-6] at the air/water interface have been studied by neutron reflection. The coverage of the surfactants was obtained over the concentration range from critical micelle concentration (CMC) to CMC/100. The area per Phi C-10 TAB molecule changes from 50 +/- 3 to 390 +/- 60 angstrom(2) over this concentration range and the area per (Phi C-10)(2)C-6 molecule changes from 139 +/- 3 to 288 +/- 10 angstrom(2). The overall thicknesses (single uniform layer) of the surfactant layers at CMC are about 19 and 16 A for Phi C(10)TAB and (Phi C-10)C-6 respectively. The distributions of the C-10 chains show that the chains of both surfactants are tilted away from surface normal, with the tilt increasing in the outer part of the layer. The distribution of C-10 chains in (Phi C-10)(2)C-6 is narrower than that in Phi C(10)TAB, indicating that the alkyl chains of (Phi C-10)C-6 are more tilted. For both surfactants, the broad nitrophenoxy distribution may indicate significant positional disorder of the nitrophenoxy groups along the surface normal direction and their intermixing with alkyl chains in the adsorbed layer. (C) 2008 Elsevier Inc. All rights reserved.
机译:N,N,N-三甲基-10-(4-硝基苯氧基)溴化十溴化铵(Phi C(10)TAB)和N,N,N',N'-四甲基-N,N'-bis [10]的吸附层通过中子反射研究了-(4-硝基苯氧基)癸基] -1,6-己二溴化二溴铵[(Phi C-10)(2)-C-6]。在临界胶束浓度(CMC)至CMC / 100的浓度范围内获得了表面活性剂的覆盖率。在此浓度范围内,每个Phi C-10 TAB分子的面积从50 +/- 3变为390 +/- 60埃(2),每个(Phi C-10)(2)C-6分子的面积从139变化+/- 3至288 +/- 10埃(2)。对于Phi C(10)TAB和(Phi C-10)C-6,在CMC处表面活性剂层的总厚度(单层均匀)分别约为19和16A。 C-10链的分布表明,两种表面活性剂的链均倾斜偏离表面法线,且在层的外部倾斜度增加。 (Phi C-10)(2)C-6中C-10链的分布比Phi C(10)TAB中的窄,表明(Phi C-10)C-6的烷基链更倾斜。对于两种表面活性剂,宽的硝基苯氧基分布可能表明硝基苯氧基沿表面法线方向的明显位置无序,并且它们与吸附层中的烷基链相互混合。 (C)2008 Elsevier Inc.保留所有权利。

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