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Future development of contrail cover, optical depth, and radiative forcing: impacts of increasing air traffic and climate change

机译:轨迹转换盖,光学深度和辐射强迫的未来发展:不断增加的空中交通和气候变化的影响

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The future development of contrails is investigated considering changes in air traffic and aircraft technology as well as climate change by means of a contrail parameterization developed for the ECHAM general circulation model. Time slice simulations show an increase in global annual mean contrail cover from 0.06 percent in 1992, to 0.14 percent in 2015, and to 0.22 percent in 2050. In the northern extratropics, the enhancement of contrail cover is mainly determined by the growth of aviation. In the Tropics, contrail cover is, additionally, highly affected by climate change. In order to quantify the effect of systematic errors in the model climate on contrail coven offline diagnostic studies are also performed. These studies suggest an underestimation of global contrail cover in the ECHAM simulations by a factor of about 0.8-0.9. The effect of the bias in the model climate is strongest in tropical latitudes. The temporal development of the simulated contrail radiative forcing is most closely related to total contrail cover, although the mean optical depth is found to increase in a warmer climate. Our best estimate is an increase of global annual mean radiative forcing from 3.5 mW or - in 1992, to 9.4 mW m~(-2) in 2015, and to 14.8 mW m~(-2) in 2050. Uncertainties in contrail radiative forcing mainly arise from uncertainties in microphysical and optical properties such as particle shape, particle size, and optical depth.
机译:考虑到空中交通和飞机技术的变化以及气候变化,通过为ECHAM通用循环模型开发的轨迹参数化技术,研究轨迹轨迹的未来发展。时间片模拟显示,全球年平均轨迹转换覆盖率从1992年的0.06%,增加到2015年的0.14%,以及2050年的0.22%。在北温带,轨迹转换覆盖率的提高主要取决于航空业的增长。在热带地区,轨迹转换的覆盖面还受到气候变化的严重影响。为了量化模型气候中系统误差对轨迹转换的影响,还进行了离线诊断研究。这些研究表明,ECHAM模拟中的总体轨迹转换覆盖率低估了约0.8-0.9。在热带地区,偏差对模式气候的影响最大。尽管发现平均光学深度在较暖的气候下会增加,但模拟的轨迹转换辐射强迫的时间变化与整个轨迹转换关系最为密切。我们最好的估计是,全球年平均辐射强迫将从1992年的3.5 mW或-增加到2015年的9.4 mW m〜(-2),到2050年增加到14.8 mW m〜(-2)。凝结辐射强迫的不确定性主要是由于微物理和光学性质的不确定性,例如颗粒形状,粒径和光学深度。

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