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Reliability Study of Ink on Stress in Single Lap Adhesive Joints

机译:单个搭接处的油墨对应力的可靠性研究

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摘要

This paper investigates the experimental reliability of SN9000 ink on the chip on film and the axial and shear stress distributions across the squared and spew end of ink in single-lap joints. The glass transition temperature of SN9000 was analyzed by a regression analysis method. The results demonstrated that for the continuous heating of a single ink drop, the confidence level is more than 96.7%. The stress field in single-lap joints with square and spew geometries was simulated by the finite element method. The stress distribution across the lap length at the interface for joints with spew ends was compared to that of square ended single lap joints. The maximum magnitude of the von Mises stress was less than the yield strength of the substrate material. These results helped us to understand that the relationship between the glass transition temperature and von Mises stress is less than the yield strength of SN9000.
机译:本文研究了SN9000墨水在薄膜芯片上的实验可靠性以及单搭接接头中墨水的平方和喷出端的轴向和剪切应力分布。通过回归分析法对SN9000的玻璃化转变温度进行了分析。结果表明,对于单个墨滴的连续加热,置信度大于96.7%。采用有限元方法模拟了具有方形和短缝几何形状的单搭接接头的应力场。比较了带有短缝末端接头的界面处整个搭接长度上的应力分布与方端单搭接接头的应力分布。冯·米塞斯应力的最大幅度小于基底材料的屈服强度。这些结果有助于我们理解玻璃化转变温度与冯·米塞斯应力之间的关系小于SN9000的屈服强度。

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