首页> 外文期刊>Journal of Alloys and Compounds: An Interdisciplinary Journal of Materials Science and Solid-state Chemistry and Physics >X-ray powder diffraction refinement of Ag_2In_2SiSe_6 structure and phase diagram of the AgInSe_2-SiSe_2 system
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X-ray powder diffraction refinement of Ag_2In_2SiSe_6 structure and phase diagram of the AgInSe_2-SiSe_2 system

机译:Ag_2In_2SiSe_6结构的X射线粉末衍射细化和AgInSe_2-SiSe_2系统的相图

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摘要

The phase diagram of the AgInSe_2-SiSe_2 system was investigated using the results of differential thermal analysis and X-ray diffraction. The existence of a new quaternary phase, Ag_2In_2SiSe_6, was discovered in the system; it melts congruently at HOOK and has a polymorphous transition at 1040 K. The crystal structure of the low-temperature (LT) modification of this phase was investigated using powder X-ray diffraction. Ag_2In_2SiSe_6 crystallizes in a monoclinic structure, space group (S.G.) Cc (structural type Ag_2In_2GeSe_6), with lattice parameters a = 1.26683(4) nm, b = 0.74565(3) nm, c = 1.26133(4) nm and beta = 109.286(2) deg. The atomic parameters were refined in the isotropic approximation to R_I = 0.0758 and R_P = 0.1096.
机译:利用差热分析和X射线衍射的结果研究了AgInSe_2-SiSe_2系统的相图。在系统中发现了一个新的四元相Ag_2In_2SiSe_6的存在。它在HOOK处完全熔化,并在1040 K处具有多态转变。使用粉末X射线衍射研究了该相的低温(LT)改性的晶体结构。 Ag_2In_2SiSe_6以单斜晶结构,空间群(SG)Cc(结构类型Ag_2In_2GeSe_6)结晶,晶格参数a = 1.26683(4)nm,b = 0.74565(3)nm,c = 1.26133(4)nm和beta = 109.286( 2)度以各向同性近似将原子参数细化为R_I = 0.0758和R_P = 0.1096。

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