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首页> 外文期刊>Journal of Applied Remote Sensing >Sparsity divergence index based on locally linear embedding for hyperspectral anomaly detection
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Sparsity divergence index based on locally linear embedding for hyperspectral anomaly detection

机译:基于局部线性嵌入的稀疏散度指数用于高光谱异常检测

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摘要

Hyperspectral imagery (HSI) has high spectral and spatial resolutions, which are essential for anomaly detection (AD). Many anomaly detectors assume that the spectrum signature of HSI pixels can be modeled with a Gaussian distribution, which is actually not accurate and often leads to many false alarms. Therefore, a sparsity model without any distribution hypothesis is usually employed. Dimensionality reduction (DR) as a preprocessing step for HSI is important. Principal component analysis as a conventional DR method is a linear projection and cannot exploit the nonlinear properties in hyperspectral data, whereas locally linear embedding (LLE) as a local, nonlinear manifold learning algorithm works well for DR of HSI. A modified algorithm of sparsity divergence index based on locally linear embedding (SDI-LLE) is thus proposed. First, kernel collaborative representation detection is adopted to calculate the sparse dictionary matrix of local reconstruction weights in LLE. Then, SDI is obtained both in the spectral and spatial domains, where spatial SDI is computed after DR by LLE. Finally, joint SDI, combining spectral SDI and spatial SDI, is computed, and the optimal SDI is performed for AD. Experimental results demonstrate that the proposed algorithm significantly improves the performance, when compared with its counterparts. (C) 2016 Society of Photo-Optical Instrumentation Engineers (SPIE)
机译:高光谱图像(HSI)具有高光谱和空间分辨率,这对于异常检测(AD)至关重要。许多异常检测器认为,可以使用高斯分布对HSI像素的光谱特征进行建模,这实际上是不准确的,并经常导致许多误报。因此,通常使用没有任何分布假设的稀疏模型。降维(DR)作为HSI的预处理步骤很重要。作为常规DR方法的主成分分析是线性投影,无法利用高光谱数据中的非线性特性,而作为线性非线性流形学习算法的局部线性嵌入(LLE)方法对于HSI的DR效果很好。提出了一种基于局部线性嵌入的稀疏散度指数改进算法(SDI-LLE)。首先,采用核协同表示检测方法计算LLE中局部重构权重的稀疏字典矩阵。然后,在频谱域和空间域中都获得SDI,其中在空间分辨率由LLE进行DR之后计算。最后,计算结合频谱SDI和空间SDI的联合SDI,并为AD执行最佳SDI。实验结果表明,与同类算法相比,该算法显着提高了性能。 (C)2016年光电仪器工程师学会(SPIE)

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