Atomic force microscopy study of rubbed polyimide films

摘要

The surface of rubbed polyimide films was studied as a function of the film thickness and applied load suing atomic force microscopy(AFM).Three domainant cosequences of rubbing on the film topography were observed:scratches confined to the near surface of the film,tears that extended tothe substrate,and strings of islands or droplets aligned parallel to the rubbing direction.Tears,found only in films less than 50 nmthick,varied in arealdensity and shape due to variatios in the film thickness,rubbing load, adhesion to the substrate.Strings of droples aligned in the rubbing direction were seem on most samples without discernible dependence on the thickness or urbbing load.