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A synchrotron tomographic energy-dispersive diffraction imaging study of the aerospace alloy Ti 6246

机译:航天合金Ti 6246的同步层析层析能量色散衍射成像研究

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A titanium alloy sample (#6246) containing a linear friction weld has been imaged nondestructively using tomographic energy-dispersive diffraction imaging (TEDDI). The diffraction patterns measured at each point of the TEDDI image permitted identification of the material and phases present (5%). The image also showed the preferred orientation and size-strain distribution present within the sample without the need for any further sample preparation. The preferred orientation was observed in clusters with average dimensions very similar to the experimental spatial resolution (400 m). The length scales and preferred orientation distributions were consistent with orientation imaging microscopy measurements made by Szczepanski, Jha, Larsen & Jones [Metall. Mater. Trans. A (2008), 39, 2841-2851] where the microstructure development was linked to the grain growth of the parent material. The use of a high-energy X-ray distribution (30-80 keV) in the incident beam reduced systematic errors due to the source profile, sample and air absorption. The TEDDI data from each voxel were reduced to an angle-dispersive form and Rietveld refined to a mean χ2 of 1.4. The mean lattice parameter error (d/d) ranged from 10-4 for the highly crystalline regions to 10-3 for regions of very strong preferred orientation and internal strain. The March-Dollase preferred orientation errors refined to an average value of 2%. A 100% correlation between observed fluorescence and diffraction peak broadening was observed, providing further evidence for vicinal strain broadening.
机译:使用断层能量色散衍射成像(TEDDI)对包含线性摩擦焊缝的钛合金样品(#6246)进行了无损成像。在TEDDI图像的每个点处测量的衍射图样可以识别出存在的材料和相(5%)。该图像还显示了样品中存在的优选方向和尺寸应变分布,而无需任何进一步的样品前处理。在平均尺寸与实验空间分辨率(400 m)非常相似的群集中观察到了首选方向。长度标度和优选的取向分布与Szczepanski,Jha,Larsen&Jones [Metall.Med。母校反式A(2008),39,2841-2851],其中微观结构的发展与母体材料的晶粒长大有关。在入射光束中使用高能X射线分布(30-80 keV)减少了由于源轮廓,样品和空气吸收而导致的系统误差。将来自每个体素的TEDDI数据简化为角度分散形式,并将Rietveld细化为1.4的平均χ2。平均晶格参数误差(d / d)范围从高结晶区域的10-4到非常强的首选方向和内部应变的区域的10-3。 March-Dollase的首选方向误差精炼到2%的平均值。观察到的荧光与衍射峰展宽之间存在100%的相关性,为附近菌株的展宽提供了进一步的证据。

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