Ordered mesoporous silica and alumina thin films studied by X-ray scattering

摘要

The use of X-ray techniques for the characterisation of ordered mesoporous films is demonstrated. Both silica and alumina thin layers with an ordered mesoporosity are studied using low-angle diffraction and grazing incidence reflectometry. It is shown how the internal structure evolves upon drying and how texture can be easily detected using a two-circle diffractometer. The reflectometry data are correlated with results from nitrogen adsorption/desorption experiments.