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Synthesis of easily testable circuits over the Zhegalkin basis in the case of constant faults of type 0 at outputs of elements

机译:在元件输出处出现类型0恒定故障的情况下,基于Zhegalkin的易于测试的电路的综合

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摘要

Methods of synthesis of easily testable circuits of functional elements over the Zhegalkin basis for arbitrary Boolean functions are suggested. It is assumed that the faults are constant faults of type 0 at outputs of elements. It is proved that any Boolean function can be realised by a circuit allowing a complete test of length 1.The research of the first author was supported by the Russian Foundation for Basic Re-search, grant 08-01-00863, and by the Program of the President of the Russian Federation for support of the leading scientific schools, grant 4470.2008.1.The research of the second author was supported by the Russian Foundation for Basic Research, grant 08-01-00648.
机译:建议在Zhegalkin基础上为任意布尔函数合成功能元件的易于测试的电路的方法。假定故障是元素输出中类型0的恒定故障。事实证明,任何布尔函数都可以通过允许对长度1进行完整测试的电路来实现。第一作者的研究得到了俄罗斯基础研究基金会的资助(授权08-01-00863),并且由该计划俄罗斯联邦总统支持领先的科学学院的研究经费4470.2008.1。,第二作者的研究得到了俄罗斯基础研究基金会的研究经费08-01-00648的支持。

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