A connection test element between the output of the means for outputting a constant logic value and the circuit input, and a means for outputting a fixed logic value and an input of a circuit,

摘要

A device including a contact circuit and means for applying a constant logic value to the input of the integrated circuit will be described. In conventional implementations of the means, pull-up and pull-down resistors are required, and these resistors require additional steps and additional measures to test the associated interconnections. An improvement is provided by the present invention in that the output of outputting a logic value during normal operation is controlled via test logic during testing. The interconnections are thus tested by the means as part of the testing of the other interconnections in the same manner.