Analytical Series Secondary Ion Mass Spectrometry of Automotive Coating Systems

摘要

Secondary ion mass spectrometry (SIMS) is a specialized form of surface analysis that is used primarily to determine the elemental and chemical structure of solid materials. It is based on mass spectrometry which is a family of techniques where elements, molecules, and molecular fragments are sorted based on their atomic/molecular weights. The technique employs a source to excite the material of interest into the gas phase with some portion of it as ionized species. The ions then pass through a mass filter which sorts them based on their mass-to-charge ratio. The resulting mass spectrum gives a representation of the elemental and/ or molecular composition of the material of interest. Often, the list of molecular fragments in the spectrum can be pieced together to obtain a detailed understanding of the chemical structure of the material.