Effect of small magnetic corrections to susceptibility on the angular dependences of the reflectivity of polarized X-rays from multilayer structures

摘要

The X-ray resonant magnetic scattering (XRMS) method allows for the determination of optical constants including magnetic corrections, which are significant near the atomic X-ray absorption edges, by the shift of the Bragg angle of the reflection from periodic multilayers. Recently, Valvidares et al. [Phys. Rev. B 78, 064406 (2008)] revealed significant differences in the shape of "magnetic" Bragg reflection peaks from a [Co_(73)Si_(27)(50 ?)/Si(30 ?)]10 film for two opposite states of antiferromagnetic interlayer ordering. Valvidares et al. assumed that these features can be explained by the presence of the reflection-induced magnetic resonance correction. We have demonstrated that such corrections in the case of antiferromagnetic structures do not lead to a shift of the Bragg peak, but the shape of magnetic peaks is explained by the interference of the magnetic and nonmagnetic reflection amplitudes.