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Effect of plasma treatments on the adhesion properties of PACVD a-SiC:H coatings on TA6V alloy

机译:等离子体处理对TA6V合金上PACVD a-SiC:H涂层附着性能的影响

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Recently, hard a-SiC:H coatings, have received considerable attention for tribological applications, in particular in the aeronautical field where titanium alloys (TA6V) are widely used. However, this increase in tribological properties is often hindered by poor adhesion of the coating due to the growth of natural oxide layers on the titanium alloy surface. This work is aimed at investigating the use of plasma pre-treatments to remove these oxide layers prior to a-SiC:H deposition. Pre-treatment and a-SiC:H deposition from tetramethylsilane are both carried out in a hybrid microwave/low frequency plasma device (dual PACVD microwave [v=2.45 GHz]/low frequency [v=50 KHz]). X-ray Photoelectron Spectroscopy analysis (XPS), coupled with in situ Ar~+ sputtering, reveals complex (TiO_2/Ti_xO_y/TiO) oxide layers. As determined from TRIM simulations, the argon ion energies required to sputter these oxide layers lie in the range 200 to 400 eV. These values are experimentally checked in the PACVD reactor in a pure argon plasma medium at variable surface DC bias. Optical Emission Spectroscopy (OES) of the atomic oxygen species, carried out in the vicinity of the sputtered surface is compared to the oxygen content measured at the interface between the film and substrate surface by post-mortem Secondary Ion Mass Spectrometry (SIMS) analysis. Finally, Atomic Force Microscopy (AFM) topographic images show that TA6V surface roughness and film adhesion as evaluated by scratch-test, are strongly correlated. These results reveal counter influence of interfacial oxygen content and surface roughness. The sputtering parameters are eventually optimised to enhance the adhesion of a-SiC:H coatings on TA6V.
机译:近来,硬质a-SiC:H涂层在摩擦学应用中受到了相当大的关注,特别是在广泛使用钛合金(TA6V)的航空领域。然而,由于钛合金表面上天然氧化物层的生长,涂层的附着力差,常常阻碍了摩擦学性能的提高。这项工作旨在研究在a-SiC:H沉积之前使用等离子体预处理除去这些氧化物层的用途。从四甲基硅烷进行预处理和a-SiC:H沉积均在混合微波/低频等离子体装置(双PACVD微波[v = 2.45 GHz] /低频[v = 50 KHz])中进行。 X射线光电子能谱分析(XPS)与原位Ar〜+溅射相结合,揭示了复杂的(TiO_2 / Ti_xO_y / TiO)氧化物层。根据TRIM模拟确定,溅射这些氧化物层所需的氩离子能量在200至400 eV的范围内。这些值是在PACVD反应器中在纯氩等离子体介质中以可变的表面DC偏压通过实验检查的。通过事后二次离子质谱分析(SIMS),将在溅射表面附近进行的原子氧种类的发射光谱(OES)与在薄膜和基材表面之间的界面处测得的氧含量进行比较。最后,原子力显微镜(AFM)的地形图显示,通过刮擦测试评估的TA6V表面粗糙度和膜附着力密切相关。这些结果揭示了界面氧含量和表面粗糙度的反作用。最终优化了溅射参数,以增强a-SiC:H涂层在TA6V上的附着力。

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