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首页> 外文期刊>Vacuum: Technology Applications & Ion Physics: The International Journal & Abstracting Service for Vacuum Science & Technology >Beam plasma discharge at low magnetic field as plasma source for plasma processing reactor
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Beam plasma discharge at low magnetic field as plasma source for plasma processing reactor

机译:低磁场下的束等离子体放电作为等离子体处理反应器的等离子体源

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The aims of the research are to study the nature of an effect detected earlier for the formation of ion flows from a beam plasma discharge and to determine possible applications of this effect. These flows propagate in a beam plasma discharge on a normal to the discharge axis. It has been found that the acceleration of ions is a consequence of the potential gradient between an area with a high level of microwave oscillations and a peripheral area of plasma. The results of physical experiments qualitatively correlate with computer simulation data. The analysis of the physical mechanism of the effect has enabled a way of effective control of the flow energy and density to be found. The capability to change the mean energy of the ion flow in the range from 20 up to 70 eV with increase in its density by an order has been demonstrated. A possible application of the effect is a novel plasma processing reactor for treatment of materials used in electronics engineering. In particular, soft etching technology of AlGaAs barrier layers in semiconducting Al GaAs/InGaAs/GaAs heterostructures has been demonstrated.
机译:该研究的目的是研究较早检测到的从束等离子体放电形成离子流的效应的性质,并确定该效应的可能应用。这些流在垂直于放电轴的束等离子体放电中传播。已经发现,离子的加速是微波振荡高的区域与等离子体的外围区域之间的电势梯度的结果。物理实验的结果与计算机仿真数据在质量上相关。对效果的物理机制的分析使得找到一种有效控制流动能和密度的方法成为可能。已经证明,随着离子密度的增加,离子流的平均能量在20到70 eV范围内变化的能力。这种效果的可能应用是用于处理电子工程中使用的材料的新型等离子体处理反应器。特别地,已经证明了在半导体Al GaAs / InGaAs / GaAs异质结构中的AlGaAs阻挡层的软蚀刻技术。

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