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首页> 外文期刊>Vacuum: Technology Applications & Ion Physics: The International Journal & Abstracting Service for Vacuum Science & Technology >APPLICABILITY OF THE RF-ONLY MODE IN A QUADRUPOLE MASS SPECTROMETER FOR DIRECT ANALYSIS OF KEV IONS
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APPLICABILITY OF THE RF-ONLY MODE IN A QUADRUPOLE MASS SPECTROMETER FOR DIRECT ANALYSIS OF KEV IONS

机译:四极质谱仪中纯射频模式直接用于KEV离子分析的适用性

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This paper describes an applicability of a quadrupole mass spectrometer (QMS) for direct analysis of high energy ions up to 3 keV without decelerating fields. The QMS uses an rf-only mode in which only an rf voltage is applied to the quadrupole, although the conventional QMS applies the coincident de and rf voltages to the quadrupole. On the rf-only mode, the rf voltage is determined by a small triangular stability zone in the Mathieu stability diagram, where the point a = 0 and q = 7.547 in the a-q plane centers on the bottom of the triangle zone and the resolution of 104 is expected. The mass spectrum for air of 3 ke V ion beams was obtained on the rf-only mode, where the O-2 peak indicated the half-height resolution of 48. It was concluded that the rf-only mode is applicable for direct analysis of keV energy order ions, although further research to eliminate the conventional q < 0.9 related large peak is essential and the elimination will be realized using the pre-filter. [References: 8]
机译:本文介绍了四极质谱仪(QMS)在不降低磁场的情况下直接分析高达3 keV的高能离子的适用性。 QMS使用仅rf模式,其中仅将rf电压施加到四极,尽管常规QMS将同时的de和rf电压施加到四极。在仅rf模式下,rf电压由Mathieu稳定性图中的一个小的三角形稳定区域确定,其中aq平面中的点a = 0和q = 7.547位于三角形区域底部,并且分辨率为预期为104。在仅rf模式下获得了3 ke V离子束空气的质谱图,其中O-2峰表示半高分辨率为48。得出结论,仅rf模式可用于直接分析keV能级离子,尽管进一步研究消除与常规q <0.9相关的大峰是必不可少的,并且消除将使用前置滤波器实现。 [参考:8]

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