首页> 外文期刊>Vacuum: Technology Applications & Ion Physics: The International Journal & Abstracting Service for Vacuum Science & Technology >Synthesis and properties of epitaxial SnO _2 films deposited on MgO (100) by MOCVD (Conference Paper)
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Synthesis and properties of epitaxial SnO _2 films deposited on MgO (100) by MOCVD (Conference Paper)

机译:MOCVD沉积在MgO(100)上的外延SnO _2薄膜的合成与性能(会议论文)

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摘要

Epitaxial tin oxide (SnO _2) thin films have been prepared on MgO (100) substrates at 500-600 °C by metalorganic chemical vapor deposition method. Structural and optical properties of the films have been investigated in detail. The obtained films were pure SnO _2 with the tetragonal rutile structure. An in-plane orientation relationship of SnO _2 (110) [010]//MgO (200) [110] between the film and substrate was determined. Two variant structure of SnO _2 were analyzed. The structure of the film deposited at 600 °C was investigated by high-resolution transmission electron microscopy, and an epitaxial structure was observed. The absolute average transmittance of the SnO _2 film at 600 °C in the visible range exceeded 90%. The optical band gap of the film was about 3.93 eV.
机译:通过金属有机化学气相沉积法在500-600°C的MgO(100)衬底上制备了外延氧化锡(SnO _2)薄膜。已经详细研究了膜的结构和光学性质。所得膜为具有四方金红石结构的纯SnO _2。确定了膜与基板之间的SnO _2(110)[010] // MgO(200)[110]的面内取向关系。分析了SnO _2的两种变异结构。通过高分辨率透射电子显微镜研究在600℃下沉积的膜的结构,并且观察到外延结构。 SnO _2薄膜在可见光区600°C的绝对平均透射率超过90%。膜的光学带隙为约3.93eV。

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