Selected research methods of structure and properties of thin films and material surfaces

摘要

CeO_2 thin films doped with copper were elaborated by Pulsed laser Deposition with variable atomic fractions of Cu (6.5, 15, 21.5,27 percent at). The thin films were characterized by means of scanning and high-resolution electron microscopy, x-ray diffraction analysis and infrared spectroscopy. The results of investigation showed structure, texture and catalytic properties modifications of the thin films with Cu content increase. Mass transport in the surface layer of yttria -stabilized zirconia was investigated at high temperatures. A very strong surface segregation of silicium, which is only a trace contamination in the bulk, was found. The diffusion of titanium and calcium in the bulk of grains adjacent to the surface and along grain boundaries was studied using the SIMS method.