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首页> 外文期刊>High Pressure Research >Interfacial tension measurement of Ni-S liquid using high-pressure X-ray micro-tomography
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Interfacial tension measurement of Ni-S liquid using high-pressure X-ray micro-tomography

机译:高压X射线显微断层仪测量Ni-S液体的界面张力

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摘要

High-pressure, high-temperature X-ray tomography experiments have been carried out using a large volume toroidal cell, which is optimized for interfacial tension measurements. A wide anvil gap, which corresponds to a field of view in the radiography imaging, was successively maintained to high pressures and temperatures using a composite plastic gasket. Obtained interfacial tensions of Ni-S liquid against Na, K-disilicate melt, were 414 and 336 mN/m at 1253 and 1293 K, respectively. Three-dimensional tomography images revealed that the sample had an irregular shape at the early stage of melting, suggesting either non-equilibrium in sample texture and force balance or partial melting of surrounding silicate. This information cannot always be obtained from two-dimensional radiographic imaging techniques. Therefore, a three-dimensional tomography measurement is appropriate for the precise interfacial measurements.
机译:已经使用大体积的环形单元进行了高压高温X射线断层扫描实验,该单元针对界面张力测量进行了优化。使用复合塑料垫片连续将一个较大的砧座间隙(对应于放射线成像的视野)保持在高压和高温下。 Ni-S液体对Na,K-二硅酸盐熔体的界面张力在1253和1293 K分别为414和336 mN / m。三维断层扫描图像显示样品在熔化的早期阶段具有不规则形状,表明样品质地和力平衡不平衡或周围硅酸盐的部分熔化。此信息不能总是从二维射线照相成像技术获得。因此,三维层析成像测量适合于精确的界面测量。

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