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Imaging scattered x-ray radiation for measurement of local electron densityin high-energy-density experiments

机译:成像散射X射线辐射以在高能密度实验中测量局部电子密度

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摘要

Imaging high-energy-density systems with scattered x-ray photons has several unique characteristicsthat differentiate it from the transmission radiography methods that have traditionally been used todiagnose these experiments. Because x-ray photons scatter primarily from the plasma electrons, thedegree of scattering from any point in a target is roughly proportional to the electron density at thatpoint. By constraining the directions of incident and scattered photons, the scattering event can belocalized, resulting in a point-wise, internal map of the target electron density. Additionally, a scatteringexperiment is not restricted to the collinear source-target-detector geometry of transmission radiog-raphy. This flexibility allows for multiple detectors to image light from a single source, though potentiallyat different scattering angles or energy bands. Presented in this paper is the theoretical underpinning forscattered x-ray imaging, as well as a description of an upcoming proof-of-principle experiment to beconducted at the OMEGA Laser Facility.
机译:用散射的X射线光子成像高能密度系统具有几个独特的特征,使其与传统上用于诊断这些实验的透射射线照相法不同。因为X射线光子主要是从等离子体电子散射,所以从目标中任何点的散射程度与该点的电子密度大致成比例。通过限制入射光子和散射光子的方向,可以对散射事件进行定位,从而生成目标电子密度的点状内部图。此外,散射实验不限于放射线照相的共线源-目标-探测器几何形状。这种灵活性允许多个检测器对来自单个光源的光成像,尽管可能以不同的散射角或能带。本文介绍的是散射X射线成像的理论基础,并描述了即将在OMEGA激光工厂进行的原理验证实验。

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