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Understanding the effect of calibration set design for the application of MCR-ALS analysis on excitation-emission matrix fluorescence (EEMF) data sets under commonly used non-negativity constraints

机译:了解校准集设计对MCR-ALS分析在常用非负性约束下的激发发射矩阵荧光(EEMF)数据集的应用的影响

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In this work, by analysing excitation-emission matrix fluorescence (EEMF) spectroscopic data sets with multivariate curve-resolution alternating least square (MCR-ALS) analysis under the commonly used mathematical constraint of non-negativity, an attempt was made to understand how the outconie of curve resolution technique can be influenced by the design of calibration sets. MCR-ALS analysis with commonly used mathematical constraints has been successfully used to analyse multi-component systems having significant spectral overlap. However, the present work showed that even for a simple system where the components do not have spectral overlap with each other, the MCR-ALS technique can resolve the spectra only if the calibration set is suitably designed. To carry out this study, three fluorophores-benzo[a]pyrene, perylene, and pyrene-having no spectral overlap with each other, were chosen. Selection of such fluorophores would enable the observation of fluorescence signatures of one fluorophore if it appears in the MCR-AIS retrieved profile of other fluorophores. Ten calibration sets with different approaches were created. EEMF data sets acquired for these calibration sets were subjected to MCR-ALS analysis. With most of the calibration sets, it was difficult to retrieve the pure EEMF spectra of all three fluorophores even if they did not have spectral overlap with each other. This work also evolved certain criterion for creating the calibration set which would enable the retrieval of pure EEMF spectra of all fluorophores of a multifluorophoric mixture using curve resolution technique. The present work clearly shows that pure spectral profiles of all the fluorophores under commonly used mathematical constraints can only be retrieved provided curve resolution analysis is performed on a suitably designed calibration set. (C) 2015 Elsevier B.V. All rights reserved.
机译:在这项工作中,通过在常用的非负性数学约束条件下通过多变量曲线分辨率交替最小二乘法(MCR-ALS)分析来分析激发发射矩阵荧光(EEMF)光谱数据集,从而尝试了了解曲线分辨率技术的局限性可能会受到校准集设计的影响。具有常用数学约束的MCR-ALS分析已成功用于分析具有明显光谱重叠的多组分系统。但是,目前的工作表明,即使对于一个简单的系统,各组件之间也不存在光谱重叠,只有适当设计了校准装置,MCR-ALS技术才能解析光谱。为了进行这项研究,选择了三个彼此之间没有光谱重叠的荧光团-苯并[a] py,per和pyr。如果此类荧光团出现在其他荧光团的MCR-AIS检索轮廓中,则选择该荧光团将使您能够观察到一种荧光团的荧光特征。创建了十种使用不同方法的校准集。对这些校准集获取的EEMF数据集进行了MCR-ALS分析。对于大多数校准集,即使所有三个荧光团彼此之间没有光谱重叠,也很难检索出它们的纯EEMF光谱。这项工作还发展了用于创建校准集的某些标准,该标准将能够使用曲线解析技术检索多荧光团混合物中所有荧光团的纯EEMF光谱。本工作清楚地表明,只有在适当设计的校准集上进行曲线分辨率分析的情况下,才能检索常用数学约束下所有荧光团的纯光谱图。 (C)2015 Elsevier B.V.保留所有权利。

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