Full width at half maximum intensity of the G band in the first order Raman spectrum of carbon material as a parameter for graphitization

摘要

The first order Raman spectrum for carbon materials has been used for structural investigation, because the ratio of the peak intensity of the D band to that of the G band I_D/I_G CAN be related linearly to the inverse of the crystallite size along the basal plane L_a as obtained firstly by Tuinstra and Koenig and then by Knight and White [1,2], On the other hand, the full width at half maximum intensity of the G band G-FWHM is known to reflect the surface crys-tallinity of carbon material [3]. The relationship between G-FWHM and the interlayer spacing d_(002), a parameter for graphitization, was investigated in this study for homogeneous carbon materials. For investigation, carbon films derived from Kapton of 25 mu m in thickness were selected, because the materials are thin, very graphitizable and typical carbon materials that have a plane orientation texture [4]. The relationship between the intensity ratio I_D/I_G and d_(002) for the Kapton-derived carbon films was also studied incidentally.