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Bonding phenomena and joint properties of transient liquid phase bonding of Ni-base single crystal superalloys

机译:Ni基单晶高温合金瞬态液相键合的键合现象及接头性能

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The bonding and crystallization behaviors of Ni-base single crystal superalloys, CMSX-2 and CMSX-4 during transient liquid phase (TLP) bonding have been investigated using MBF-80 and F-24 insert metals. Joint strength was evaluated using tensileand creep rupture testing at the elevated temperature. TLP-bonding of Ni-base single crystal superalloys was carried out at 1373-1548 K for 0-19.6 ks in vacuum and the (001) plane of each test specimen was always aligned perpendicular to the jointinterface. The dissolution width at the bonding temperature increased when the bonding temperature and holding time increased. The eutectic width decreased linearly with the square root of holding time during isothermal solidification. Electron backscattering patterns of completed joints revealed that the bonded interlayer had single-crystallized during the TLP-bonding process and matched the crystallographic orientation of the bonded substrates. The elevated temperature tensile strength and creeprupture strength of the joints indicated the identical levels of the base metals.
机译:使用MBF-80和F-24插入金属研究了Ni基单晶高温合金CMSX-2和CMSX-4在瞬态液相(TLP)键合过程中的键合和结晶行为。在高温下使用拉伸和蠕变断裂测试评估了接头强度。 Ni基单晶高温合金的TLP键合在真空中于1373-1548 K下进行0-19.6 ks,并且每个试样的(001)平面始终垂直于接头界面。当结合温度和保持时间增加时,在结合温度下的溶解宽度增加。在等温凝固过程中,共晶宽度随保持时间的平方根线性减小。完整接头的电子反向散射图谱表明,键合中间层在TLP键合过程中已单晶化,并且与键合衬底的晶体学取向相匹配。接头的高温拉伸强度和蠕变断裂强度表明基本金属含量相同。

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