The Au intercalation from the electrode into polycrystalline C-60 and C-70 thin films is studied by time dependent and space resolved studies of electrical resistivity measurements under oxygen free controlled atmosphere at different temperatures and applied voltages. The resistivity changes are interpreted on the basis of field induced metal diffusion with a subsequent formation of local phases MxC60, MxC70. A comparison of different features of C-60 and C-70 provides evidence that the process is sensitive to the electronic levels structure of the corresponding molecules. (C) 1998 Published by Elsevier Science Ltd. All rights reserved. [References: 5]
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