首页> 外文期刊>X-Ray Spectrometry: An International Journal >An investigation of x-ray escape for an HPGe detector
【24h】

An investigation of x-ray escape for an HPGe detector

机译:HPGe探测器的X射线逃逸研究

获取原文
获取原文并翻译 | 示例
           

摘要

X-ray escape peaks for a planar HPGe detector were investigated for a point source of photons with 59.5 keV energy. The effect of the solid angle for the incident photons on the escape probability of Ge K x-rays was studied using collimators with varying apertures. A Monte Carlo program was also developed to estimate the probability of escape for various mechanisms and routes. The experimental and simulation results showed that the escape probability is essentially constant for a wide range of collimator radii, but at first starts to increase and then becomes constant when the side surface of the detector becomes accessible for escape with larger collimators. Copyright (C) 2003 John Wiley Sons, Ltd. [References: 19]
机译:对于具有59.5 keV能量的光子点源,研究了平面HPGe检测器的X射线逃逸峰。使用具有不同孔径的准直器研究了入射角的立体角对Ge K x射线逃逸几率的影响。还开发了蒙特卡洛程序来估计各种机制和路线逃生的可能性。实验和模拟结果表明,对于大范围的准直仪半径,逃逸几率基本上是恒定的,但首先开始增加,然后当检测器的侧面可通过较大的准直仪逃逸时变为恒定。版权所有(C)2003 John Wiley Sons,Ltd. [引用:19]

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号