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Effective atomic numbers and electron densities of CuGaSe2 semiconductor in the energy range 6-511 keV

机译:能量范围为6-511 keV的CuGaSe2半导体的有效原子序数和电子密度

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摘要

The effective atomic numbers and electron densities of the CuGaSe2 semiconductor were calculated at 29 different energies from 6.9 to 511.0 keV by using the measured mass attenuation coefficients. Also, the mass attenuation coefficients for Cu, Ga, and Se elements were obtained at this energy range. The samples were irradiated using Cd-109, Co-57, Ba-133, and Na-22 radioactive sources. The x-ray energies were obtained using secondary targets. The gamma and x-rays were counted by an Ultra-LEGe detector with a resolution of 0.55 at 122.0 keV. The mass attenuation coefficients were compared with theoretical ones obtained using the XCOM program.
机译:通过使用测得的质量衰减系数,在6.9至511.0 keV的29种不同能量下计算了CuGaSe2半导体的有效原子序数和电子密度。同样,在该能量范围内获得了Cu,Ga和Se元素的质量衰减系数。使用Cd-109,Co-57,Ba-133和Na-22放射源辐照样品。 X射线能量是使用次级靶获得的。 γ和X射线由Ultra-LEGe检测器计数,分辨率为122.0 keV时为0.55。将质量衰减系数与使用XCOM程序获得的理论衰减系数进行比较。

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