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A versatile Monte Carlo package for computation of efficiencies of Si(Li), SDD and Ge detectors

机译:通用的蒙特卡洛软件包,用于计算Si(Li),SDD和Ge探测器的效率

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Currently, most detector efficiency calculations for X-ray detectors assume that the source is a point source on the axis of symmetry of the detector, but this is not always accurate. We have devised a Monte Carlo program to simulate photon transport in Si(Li), SOD and planar Ge detectors that natively handles finite, tilted and off-axis sources. Although electron transport is not handled at this stage, photon transport is completely handled, including absorption from filters and multiple scattering in the detector crystal. The K escape peak is handled for both silicon and germanium detectors, and the L escape peak is also handled for germanium detectors. Our efficiency results compare very well with previous work when idealized systems are simulated, and the effect of a non-idealized system is presented. Escape peak intensity ratios are given for both silicon detectors (K peak only) and germanium detectors (K and L peaks), and the results for the K escape peaks agree well with previous work. Results are presented for a recent annular detector system, which is a good example of systems that are poorly handled under previous efficiency calculations.
机译:当前,大多数用于X射线探测器的探测器效率计算都假设该源是探测器对称轴上的点源,但这并不总是准确的。我们设计了一个蒙特卡洛程序,以模拟Si(Li),SOD和平面Ge检测器中的光子传输,该检测器本身可以处理有限,倾斜和离轴源。尽管在此阶段未处理电子传输,但已完全处理了光子传输,包括来自滤镜的吸收和检测器晶体中的多次散射。硅和锗探测器均处理K逸出峰,锗探测器也处理L逸出峰。当对理想化系统进行仿真时,我们的效率结果与先前的工作非常吻合,并且提出了非理想化系统的效果。给出了硅探测器(仅K峰)和锗探测器(K和L峰)的逸出峰强度比,并且K逸出峰的结果与以前的工作非常吻合。给出了最近的环形检测器系统的结果,这是在以前的效率计算下处理不善的系统的一个很好的例子。

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