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In situ real time nanowear testing method of optical functional thin films

机译:光学功能薄膜的原位实时纳米磨损测试方法

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In the present work, we propose a new approach allowing for the in-situ real time observation of wear mechanisms of optical thin films on the nanoscale. The nanowear tests were performed using the scanning probe imaging and 2D monitoring capabilities of a depth-sensing nanoindenter. By recording the topographic and coefficient of friction (COF) images, it is possible to retrace the history of the wear track in real time. This method allows one to distinguish between different stages of wear related to different mechanisms (running-in, abrasive wear, and surface fatigue). This new approach is illustrated for a SiO2 thin film deposited onto a plastic substrate. The proposed methodology can be generalized and applied to a wide variety of functional and tribological systems. (C) 2015 Elsevier Ltd. All rights reserved.
机译:在目前的工作中,我们提出了一种新方法,可以在纳米级上实时实时观察光学薄膜的磨损机理。使用深度感应纳米压痕仪的扫描探针成像和2D监视功能执行纳米磨损测试。通过记录地形和摩擦系数(COF)图像,可以实时追溯磨损轨迹的历史记录。这种方法可以区分与不同机理(磨合,磨料磨损和表面疲劳)相关的不同磨损阶段。对于沉积在塑料基板上的SiO2薄膜,说明了这种新方法。所提出的方法可以被概括并应用于各种各样的功能和摩擦学系统。 (C)2015 Elsevier Ltd.保留所有权利。

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