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Al_2O_3 films grown by glow discharge plasma aluminising

机译:辉光放电等离子体渗铝生长Al_2O_3薄膜

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摘要

Aluminising of 9Cr steel substrates followed by heat treatment has been attempted to generate Al_2O_3 films along with Fe-Al diffusion zone at the coating/substrate interface. Effect of glow discharge plasma processing on the phase and microstructure of resultant alumina films in comparison with thermally processed samples has been reported. The thermal and plasma treated samples were characterised using X-ray diffraction, scanning electron microscopy-energy dispersive X-ray spectroscopy, electron probe microanalysis, X-ray photoelectron spectroscopy (XPS) and nanoindentation techniques. X-ray diffraction and XPS studies revealed γ-Al_2O_3 phase in both thermal and plasma processed samples. The XPS data indicated higher binding energies in plasma processed Al_2O_3 films as compared to thermally processed Al_2O_3 films. Scanning electron microscopy observations revealed cracks in thermally grown Al_2O_3 films while the same was not observed in plasma processed films. The EDX analysis revealed Fe(AI) diffusion layer of ~3 μm in plasma processed films while the same was not observed in thermally treated samples. Nanoindentation tests on plasma grown alumina films indicated 16.96 GPa hardness while hardness for thermally grown alumina films was found to be 9.95 GPa. The role of plasma in generating a crack free alumina film has been discussed.
机译:已尝试对9Cr钢基底进行渗铝,然后进行热处理,以在涂层/基底界面处生成Fe_2Al扩散区以及Al_2O_3薄膜。与热处理后的样品相比,辉光放电等离子体处理对所得氧化铝膜的相和微结构的影响已有报道。使用X射线衍射,扫描电子显微镜-能量色散X射线光谱,电子探针显微分析,X射线光电子能谱(XPS)和纳米压痕技术对经过热处理和等离子体处理的样品进行表征。 X射线衍射和XPS研究表明,热和等离子体处理的样品中都有γ-Al_2O_3相。 XPS数据表明,与经热处理的Al_2O_3膜相比,在等离子体处理的Al_2O_3膜中具有更高的结合能。扫描电子显微镜观察表明,热生长的Al_2O_3膜中存在裂纹,而在等离子处理的膜中未观察到裂纹。 EDX分析表明,在等离子处理过的薄膜中,Fe(Al)扩散层约为3μm,而在热处理过的样品中未观察到。在等离子生长的氧化铝膜上的纳米压痕测试表明硬度为16.96 GPa,而热生长的氧化铝膜的硬度为9.95 GPa。已经讨论了等离子体在产生无裂纹的氧化铝膜中的作用。

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