...
【24h】

XPS and AES studies of UHTC ZrB_2-SiC-Si_3N_4 treated with solar energy

机译:太阳能处理的UHTC ZrB_2-SiC-Si_3N_4的XPS和AES研究

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

The microstructure of ultra-high-temperature ceramics based on the ZrB_2-SiC composition and a sintering additive (Si_3N_4) was investigated using XPS and AES techniques. These ZrB_2-SiC-Si_3N_4 materials were treated in air plasma at high temperature (T>1750 K) in the MESOX facility developed at the PROMES-CNRS laboratory (Moyen d'Essai Solaire d'OXydation for the measurement of atomic oxygen recombination coefficients). The surfaces were characterized before and after the air plasma treatment. Surface modifications were observed and induced by the oxidation process. The elementary composition was determined using AES and XPS. Core level spectroscopy (XPS) was used to determine the atomic composition and the nature of the chemical bonds from the Zr 3d_(3/2,5/2), Si 2p_(1/2,3/2), O 1s and C 1s photoelectron peaks. The microstructural analyses revealed the presence of oxide layers: Silica and zirconia compounds were detected at temperatures near 1800 K, and a zirconia compound was mainly detected above 2200 K.
机译:利用XPS和AES技术研究了基于ZrB_2-SiC成分和烧结添加剂(Si_3N_4)的超高温陶瓷的微观结构。这些ZrB_2-SiC-Si_3N_4材料在PROMES-CNRS实验室开发的MESOX装置(用于测量原子氧复合系数的Moyen d'Essai Solaire d'OXydation)中在高温(T> 1750 K)的空气等离子体中进行了处理。 。在空气等离子体处理之前和之后表征表面。观察到表面改性并通过氧化过程诱导。使用AES和XPS确定基本组成。核心能谱(XPS)用于确定Zr 3d_(3 / 2,5 / 2),Si 2p_(1 / 2,3 / 2),O 1s和C的原子组成和化学键的性质1s光电子峰。微观结构分析表明存在氧化物层:在接近1800 K的温度下检测到二氧化硅和氧化锆化合物,主要在2200 K以上的温度下检测到氧化锆化合物。

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号