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SIMS analysis of Rb-doped hollow-core photonic band-gap silica fiber using a CAMECA 4550 instrument

机译:使用CAMECA 4550仪器对掺Rb的空心光子带隙石英光纤进行SIMS分析

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摘要

A hollow-core photonic band-gap fiber exposed to Rb vapor was studied using quadrupole-based SIMS. The Rb concentration along 30-cm fibers was analyzed using a Cs~+ beam. Effective charge compensation was obtained in the fiber cross-section without using any metal coating. A low Rb detection limit of about 6 × 10~(15) atoms/cm~3 was obtained in the silica microstructure region of the fiber. SIMS results revealed variations in the longitudinal distribution of Rb in fibers exposed to different loading conditions. Ion imaging of the fiber cross-section using a Ga~+ beam revealed the confinement of Rb atoms to the microstructured photonic region of the fiber, as opposed to the solid glass cladding.
机译:使用基于四极的SIMS研究了暴露于Rb蒸气的中空光子带隙光纤。使用Cs〜+束分析沿30厘米纤维的Rb浓度。在不使用任何金属涂层的情况下,在纤维横截面上获得了有效的电荷补偿。在纤维的二氧化硅微结构区域中获得了大约6×10〜(15)原子/ cm〜3的低Rb检测极限。 SIMS结果显示暴露于不同负载条件的纤维中Rb的纵向分布变化。使用Ga〜+束对纤维截面进行离子成像显示,与固体玻璃包层相反,Rb原子局限于纤维的微结构光子区域。

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