首页> 外文期刊>Surface and Interface Analysis: SIA: An International Journal Devoted to the Development and Application of Techniques for the Analysis of Surfaces, Interfaces and Thin Films >Summary of ISO/TC 201 Standard: ISO 29081: 2010, surface chemical analysis-Auger electron spectroscopy-reporting of methods used for charge control and charge correction
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Summary of ISO/TC 201 Standard: ISO 29081: 2010, surface chemical analysis-Auger electron spectroscopy-reporting of methods used for charge control and charge correction

机译:ISO / TC 201标准摘要:ISO 29081:2010,表面化学分析-俄歇电子能谱-电荷控制和电荷校正方法的报告

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摘要

This international standard specifies the minimum amount of information required for describing the methods of charge control and charge correction in measurements of Auger electron transitions from insulating specimens by electron-stimulated AES to be reported with the analytical results. Information is provided in an Annex on methods that have been found useful for charge control prior to or during AES analysis. The Annex also includes a summary table of methods or approaches, ordered by simplicity of approach. A similar international standard has been published for XPS (ISO 19318: 2003(E), Surface chemical analysis-XPS-reporting of methods used for charge control and charge correction.
机译:该国际标准规定了描述通过电子刺激AES测量绝缘样品产生的俄歇电子跃迁时描述的电荷控制和电荷校正方法所需的最少信息量,并将这些信息与分析结果一起报告。附件中提供了有关在AES分析之前或之中对电荷控制有用的方法的信息。附件还包括方法或方法的摘要表,按方法的简单性排序。 XPS已发布了类似的国际标准(ISO 19318:2003(E),表面化学分析-XPS-报告用于电荷控制和电荷校正的方法。

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