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Organic-inorganic behaviour of HMDSO films plasma-polymerized at atmospheric pressure

机译:常压等离子体聚合的HMDSO膜的有机-无机行为

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摘要

Recently, plasma-polymerization at atmospheric pressure has become a promising technology due to its reduced equipment costs and its possibility of in-line processing. This paper focuses on plasma deposition by an atmospheric pressure dielectric barrier discharge (DBD) using hexamethyldisiloxane (HMDSO) as gaseous precursor. HMDSO plasma-polymerized films are deposited onto polyethylene terephthalate (PET) films using argon and different argon/air mixtures as carrier gases. The chemical and physical properties of the obtained coatings are discussed using contact angle measurements, Fourier transform infrared spectroscopy (FTIR) and atomic force microscopy (AFM). Contact angle and FTIR results show that the composition of the gas phase and the chemical structure of the obtained coatings are clearly correlated. When pure argon is used as working gas. the film is polymeric with a structure close to [(CH3)(2)-Si-O](n). However, with increasing air content, a gradual change is observed from organic polydimethylsiloxane-like coatings to inorganic, quartz-like deposits. AFM results clearly indicate that with increasing air content, the deposition rate decreases, while the surface of the deposited films becomes rougher. From this point of view, the capability of controlling both chemical and physical properties of the plasma-polymerized films by varying operation conditions opens interesting perspectives.
机译:近来,由于其降低的设备成本和在线处理的可能性,在大气压下的等离子体聚合已经成为有前途的技术。本文重点研究了使用六甲基二硅氧烷(HMDSO)作为气态前体的大气压介电势垒放电(DBD)进行的等离子体沉积。使用氩气和不同的氩气/空气混合物作为载气,将HMDSO等离子聚合的膜沉积到聚对苯二甲酸乙二醇酯(PET)膜上。使用接触角测量,傅立叶变换红外光谱(FTIR)和原子力显微镜(AFM)讨论了所得涂层的化学和物理性能。接触角和FTIR结果表明,气相组成与所得涂层的化学结构之间存在明显的相关性。使用纯氩气作为工作气体时。该膜是聚合物,其结构接近[(CH3)(2)-Si-O](n)。然而,随着空气含量的增加,观察到从有机聚二甲基硅氧烷类涂料到无机,石英类沉积物的逐渐变化。 AFM结果清楚地表明,随着空气含量的增加,沉积速率降低,而沉积膜的表面变得更粗糙。从这一观点出发,通过改变操作条件来控制等离子体聚合膜的化学和物理性质的能力打开了有趣的观点。

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