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Surface analysis of fluorine-containing thin films fabricated by various plasma polymerization methods

机译:通过各种等离子体聚合方法制备的含氟薄膜的表面分析

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摘要

Plasma-polymerized fluorine-containing thin films were fabricated by five different plasma methods, viz. inductively coupled plasma (ICP), pulsed-plasma (PP), capacitively coupled plasma (CCP), self-ignition plasma (SIP), and plasma source ion implantation/inductively coupled plasma (PSII/ICP). Octafluoropropane (C3F8) was mixed with acetylene (C2H2) to investigate the effect of different plasma techniques on the films. The properties of the plasma polymers, viz. hydrophobic properties, binding structure, deposition rate, and chemical composition, varied considerably depending on the plasma polymerization method. The plasma-polymerized thin films made by the different methods were characterized using surface analytical instruments: field-emission scanning electron microscope (FE-SEM), atomic force microscope (AFM), X-ray photoelectron spectroscopy (XPS), near-edge X-ray absorption fine structure (NEXAFS), and time-of-flight secondary ion mass spectrometry (TOF-SIMS). Cross-section images from FE-SEM revealed that the deposition rate of the polymer film in the case of using CCP plasma was higher while that for PSII/ICP and self-ignidon plasma, respectively, was lower compared with the deposition rate of the ICP and pulsed-plasma. The water contact angle measurement showed that the ICP and PSII/ICP techniques produced more hydrophobic surfaces. XPS and TOF-SIMS analyses indicated that the ICP and PSII/ICP methods produced more F-containing functional groups, especially CF2 and CF3 groups. Also, the NEWS results revealed that the ICP and PSII/ICP techniques provide more fluorine species on the plasma polymer surface compared with other techniques. (C) 2009 Elsevier B.V. All rights reserved.
机译:等离子聚合的含氟薄膜是通过五种不同的等离子方法制造的。电感耦合等离子体(ICP),脉冲等离子体(PP),电容耦合等离子体(CCP),自燃等离子体(SIP)和等离子体源离子注入/电感耦合等离子体(PSII / ICP)。将八氟丙烷(C3F8)与乙炔(C2H2)混合,以研究不同等离子体技术对薄膜的影响。等离子聚合物的特性,即。疏水性,结合结构,沉积速率和化学组成根据等离子体聚合方法而有很大不同。使用表面分析仪对通过不同方法制备的等离子体聚合薄膜进行表征:场发射扫描电子显微镜(FE-SEM),原子力显微镜(AFM),X射线光电子能谱(XPS),近边缘X射线吸收精细结构(NEXAFS)和飞行时间二次离子质谱(TOF-SIMS)。 FE-SEM的横截面图像显示,与使用ICP的沉积速率相比,在使用CCP等离子体的情况下,聚合物膜的沉积速率更高,而用于PSII / ICP和自点火等离子体的沉积速率则更低。和脉冲等离子体。水接触角测量表明,ICP和PSII / ICP技术可产生更多的疏水表面。 XPS和TOF-SIMS分析表明,ICP和PSII / ICP方法可产生更多的含F官能团,尤其是CF2和CF3基团。另外,新闻结果还表明,与其他技术相比,ICP和PSII / ICP技术在等离子体聚合物表面上提供了更多的氟种类。 (C)2009 Elsevier B.V.保留所有权利。

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