首页> 外文期刊>Theoretical and Applied Genetics: International Journal of Breeding Research and Cell Genetics >Quantitative trait locus responsible for resistance to Aphanomyces root rot (black root) caused by Aphanomyces cochlioides Drechs. in sugar beet
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Quantitative trait locus responsible for resistance to Aphanomyces root rot (black root) caused by Aphanomyces cochlioides Drechs. in sugar beet

机译:数量性状基因座负责抵抗由Aphanomyces cochlioides Drechs引起的Aphanomyces根腐病(黑根)。甜菜

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摘要

Aphanomyces root rot, caused by Aphanomyces cochlioides Drechs., is one of the most serious diseases of sugar beet (Beta vulgaris L.). Identification and characterization of resistance genes is a major task in sugar beet breeding. To ensure the effectiveness of marker-assisted screening for Aphanomyces root rot resistance, genetic analysis of mature plants' phenotypic and molecular markers' segregation was carried out. At a highly infested field site, some 187 F(2) and 66 F(3) individuals, derived from a cross between lines 'NK-310mm-O' (highly resistant) and 'NK-184mm-O' (susceptible), were tested, over two seasons, for their level of resistance to Aphanomyces root rot. This resistance was classified into six categories according to the extent and intensity of whole plant symptoms. Simultaneously, two selected RAPD and 159 'NK-310mm-O'-coupled AFLP were used in the construction of a linkage map of 695.7 cM. Each of nine resultant linkage groups was successfully anchored to one of nine sugar beet chromosomes by incorporating 16 STS markers. Combining data for phenotype and molecular marker segregation, a single QTL was identified on chromosome III. This QTL explained 20% of the variance in F(2) population (in the year 2002) and 65% in F(3) lines (2003), indicating that this QTL plays a major role in the Aphanomyces root rot resistance. This is the first report of the genetic mapping of resistance to Aphanomyces-caused diseases in sugar beet.
机译:由Aphanomyces cochlioides Drechs。引起的Aphanomyces根腐病是甜菜(Beta vulgaris L.)最严重的疾病之一。抗性基因的鉴定和表征是甜菜育种的主要任务。为确保标记辅助筛选对Aphanomyces根腐病的抗性,对成熟植物的表型和分子标记的分离进行了遗传分析。在疫情严重的现场,大约有187 F(2)和66 F(3)个体,来自“ NK-310mm-O”(高度抗性)和“ NK-184mm-O”(易感)之间的杂交,在两个季节中,对它们对Aphanomyces根腐病的抗性水平进行了测试。根据整个植物症状的程度和强度,这种抗性分为六类。同时,两个选定的RAPD和159个“ NK-310mm-O”偶联的AFLP被用于构建695.7 cM的连锁图。通过整合16个STS标记,成功地将9个连接基团中的每一个成功锚定到9个甜菜染色体之一。结合表型和分子标记分离的数据,在染色体III上鉴定出单个QTL。此QTL解释了F(2)种群中20%的方差(2002年)和F(3)系中的65%(2003年),表明此QTL在Aphanomyces根腐病抗根腐病中起主要作用。这是甜菜中对Aphanomyces引起的疾病抗性的遗传图谱的首次报道。

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