Local surface skimming longitudinal wave velocity and residual stress mapping

摘要

Local variation in surface skimming longitudinal wave (SSLW) velocity has been measured using a scanning acoustic microscope. A very narrow width electrical impulse has been used to excite the transducer of the acoustic lens. This permits the separation of the SSLW signal from the direct reflected signal in the time domain. A simple method of measuring the time delay between the directly reflected signal and the SSLW signal at two defocuses has been utilized for the local measurement of SSLW velocity. The variation in the SSLW velocity measured over an area of the sample is scaled and presented as an image. The method has been implemented to image the variation of the SSLW velocity around a crack tip in a sample of Ti-6Al-4V. Since the SSLW velocity is known to change linearly with the stress, the SSLW velocity image is considered as a representation of the image of stress around the crack tip. Local stress variation in the same region of the crack tip is directly measured using x-ray diffraction. The SSLW velocity image is compared with the x-ray diffraction stress image. The contrast in the two images, spatial resolution, and the penetration depth into the sample of acoustic waves and x rays are discussed.