首页> 外文期刊>The journal of physics and chemistry of solids >M _xTiSe _2 (M=Cr, Mn, Cu) electronic structure study by methods of resonance X-ray photoemission spectroscopy and X-ray absorption spectroscopy (Conference Paper)
【24h】

M _xTiSe _2 (M=Cr, Mn, Cu) electronic structure study by methods of resonance X-ray photoemission spectroscopy and X-ray absorption spectroscopy (Conference Paper)

机译:M _xTiSe _2(M = Cr,Mn,Cu)电子结构的共振X射线光发射光谱法和X射线吸收光谱法研究(会议论文)

获取原文
获取原文并翻译 | 示例
           

摘要

Intercalation of Cu and Mn between the layers of TiSe _2 leads to the charge transfer from the doped atom to Ti atoms, electronic states of which form the conduction band of TiSe _2. This situation drastically differs from another one being observed during intercalation of other transition metals into TiSe _2 that leads to the formation of covalent complexes consisting of intercalated atom and nearest neighborhood of the host lattice. Substitution of Ti by Cr in the host lattice positions does not show both charge transfer nor formation of covalent complexes.
机译:在TiSe _2层之间插入Cu和Mn导致电荷从掺杂原子转移到Ti原子,其电子态形成TiSe _2的导带。这种情况与将其他过渡金属插入TiSe _2期间观察到的另一种情况截然不同,后者导致形成由插入原子和主体晶格的最近邻域组成的共价络合物。在主晶格位置用Cr取代Ti既不显示电荷转移也不显示共价络合物的形成。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号