首页> 外文期刊>The journal of physical chemistry, C. Nanomaterials and interfaces >Argon Adsorption on MCM-41 Mesoporous Crystal Studied by In Situ Synchrotron Powder X-ray Diffraction
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Argon Adsorption on MCM-41 Mesoporous Crystal Studied by In Situ Synchrotron Powder X-ray Diffraction

机译:原位同步加速器粉末X射线衍射研究MCM-41介孔晶体上的氩吸附

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摘要

Equilibrium argon adsorption from the gas phase on mesoporous MCM-41 silica of hexagonal structure is directly studied by in situ synchrotron powder X-ray diffraction(XRD)measurements at SPring-8.The diffraction intensity data is analyzed by extending the previously developed analytical formula for the crystal structure factors of MCM-41 to account for argon adsorbed in the pores.It is clearly observed that argon adsorbs in layers on the pore walls at low gas pressures and exhibits sudden capillary condensation as the gas pressure increased.The proposed method of interpretation of XRD data allows one to calculate the density ratio between the silica wall and condensed argon,the pore size,and the pore wall fluctuation/roughness,together with the thickness of the adsorbed layer as a function of the gas pressure.The results of in situ XRD experiments are compared with the results of argon adsorption volumetric experiments.The adsorption data are interpreted with the quench solid density functional theory(QSDFT),which takes into account the pore wall roughness.The perfect agreement of the QSDFT isotherm predicted from the adsorption data and the XRD recalculated isotherm suggests that the adsorption porosimetry and XRD measurements can be reconciled provided a proper interpretation of the experimental data.
机译:通过在SPring-8上进行原位同步加速器粉末X射线衍射(XRD)测量,直接研究了六方结构介孔MCM-41二氧化硅上气相对氩的平衡吸附,并通过扩展先前建立的分析公式来分析衍射强度数据。由于MCM-41的晶体结构因数是氩吸附在孔中的原因,因此可以清楚地观察到,在低气压下,氩会吸附在孔壁上的层中,并且随着气压的增加,毛细管会突然凝结。对XRD数据的解释允许人们计算二氧化硅壁与冷凝氩气的密度比,孔径,孔壁波动/粗糙度以及被吸附层的厚度随气压的变化。将原位XRD实验与氩气吸附体积实验的结果进行比较。用淬灭固体密度f解释吸附数据。根据吸附数据预测的QSDFT等温线与XRD重新计算的等温线的完美吻合表明,吸附孔隙率法和XRD测量值可以调和,为实验提供了适当的解释数据。

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