首页> 外文期刊>The journal of physical chemistry, C. Nanomaterials and interfaces >In Situ Stress and Nanogravimetric Measurements During Underpotential Deposition of Pb on (111)-Textured Au
【24h】

In Situ Stress and Nanogravimetric Measurements During Underpotential Deposition of Pb on (111)-Textured Au

机译:(111)织构的Au上Pb的欠电位沉积过程中的原位应力和纳米重力测量

获取原文
获取原文并翻译 | 示例
       

摘要

The surface stress associated with the underpotential deposition (upd) of lead on (11 l)-textured Au is examined, using the wafer curvature method, in acidic perchlorate supporting electrolyte. The surface stress is correlated to theta, the fractional Pb coverage, by independent nanogravimetric measurements using an electrochemical quartz crystal nanobalance (EQNB). The gravimetric results are similar to the data found in the literature, showing an electrosorption valency of 2 and the formation of a hexagonal close-packed monolayer of Pb. The complete Pb monolayer causes an overall compressive surface stress change of about -1.2 N m~(-1). The stress-coverage curve can be divided into two linear regions separated by a plateau. The region at low to intermediate coverage is caused by the formation of Au-Pb bonds which decrease the charge density and reduce the tensile surface stress inherent to the clean Au surface. In the second linear region at high coverage, the Pb adlayer compresses and behaves as a free-standing elastic film with a biaxial modulus close to that for Pb (111) in the bulk. The plateau that separates these two linear regions corresponds to the stress relaxation "hump" that appears in the stress-potential curve. This stress relaxation is attributed to island coalescence.
机译:使用晶片曲率法,在酸性高氯酸盐支持电解质中,检查了与铅在(11 l)织构的Au上的欠电位沉积(upd)相关的表面应力。通过使用电化学石英晶体纳米天平(EQNB)进行独立的纳米重力测量,可以将表面应力与theta(分数Pb覆盖率)相关联。重量分析结果与文献中的数据相似,显示出2的电吸附化合价和六方密堆积的Pb单层的形成。完整的Pb单层导致整体压缩表面应力变化约为-1.2 N m〜(-1)。应力覆盖曲线可以分为两个由平稳区分开的线性区域。低至中等覆盖率的区域是由Au-Pb键的形成引起的,Au-Pb键降低了电荷密度并降低了纯净Au表面固有的拉伸表面应力。在高覆盖率的第二线性区域中,Pb吸附层压缩并表现为独立的弹性膜,其双轴模量与整体中的Pb(111)接近。分隔这两个线性区域的平台对应于出现在应力-势能曲线中的应力松弛“峰”。这种应力松弛归因于岛聚结。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号