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首页> 外文期刊>The journal of physical chemistry, C. Nanomaterials and interfaces >Interface Dipole and Schottky Barrier Formation at Au/CdZnTe(111)A Interfaces
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Interface Dipole and Schottky Barrier Formation at Au/CdZnTe(111)A Interfaces

机译:Au / CdZnTe(111)A界面上的界面偶极子和肖特基势垒形成

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Synchrotron radiation photoemission spectroscopy (SRPES) has been used to study the electronic structure of the Au/CdZnTe(l 11)A for Au coverage ranging from about 0.3 up to 20 monolayers (ML). It is found that a Schottky barrier with a height of 0.82 eV is formed at the initial deposition of Au. This barrier decreases gradually with increasing Au coverage, which can be ascribed to band bending caused by charge redistribution at the interface and the formation of a positive interface dipole introduced by Cd diffusion. After an annealing process, a signal due to the formation of Au-Cd alloy caused by exquisite Cd diffusion into Au overlayer is observed, and simultaneously the Schottky barrier height (SBH) reduces to 0.32 eV. The present work indicates that cation diffusion into metal overlayer plays a critical role in controlling the SBH.
机译:同步辐射光发射光谱法(SRPES)已用于研究Au / CdZnTe(11)A的电子结构,其Au覆盖范围从0.3到20个单层(ML)。发现在Au的初始沉积时形成了高度为0.82eV的肖特基势垒。该势垒随着Au覆盖率的增加而逐渐减小,这可以归因于由界面处电荷的重新分布和Cd扩散引入的正界面偶极子的形成引起的能带弯曲。经过退火处理后,观察到由于Cd扩散到Au层中而引起的Au-Cd合金形成的信号,同时肖特基势垒高度(SBH)降低到0.32 eV。目前的工作表明,阳离子扩散到金属覆盖层中对控制SBH起着至关重要的作用。

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