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首页> 外文期刊>The International Journal of Advanced Manufacturing Technology >Clustering with removing outliers - a case of an IC packaging company
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Clustering with removing outliers - a case of an IC packaging company

机译:聚类并消除异常值-以一家IC封装公司为例

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摘要

Companies that produce semiconductors are exposed to greater challenges because of complex manufacturing systems used and competitive business environments encountered. Improving the machine performance has been and will remain to be a critical role in deciding the success of a company. In this paper, we apply the clustering techniques to partition the wire bond machines in a packaging company into groups so that management levels can improve the productivity based on the clustering results. Moreover, to gain an insight into how outliers affect the clustering results, we remove those outliers based on the visual results of self-organizing map (SOM) algorithm. Comparing this result with the one with outliers, we found that removing outliers leads to better clustering based on the Wilk's lambda value.
机译:由于使用了复杂的制造系统以及遇到了竞争性的商业环境,生产半导体的公司面临着更大的挑战。改善机器性能一直是并将继续是决定公司成功的关键。在本文中,我们应用聚类技术将包装公司中的引线键合机分为几类,以便管理级别可以根据聚类结果提​​高生产率。此外,为了深入了解离群值如何影响聚类结果,我们根据自组织映射(SOM)算法的视觉结果删除了这些离群值。将该结果与具有异常值的结果进行比较,我们发现,基于Wilk的lambda值,消除异常值可导致更好的聚类。

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