Acceptance sampling plans for multi-stage process based on time-truncated test for Weibull distribution

摘要

In this manuscript, we will focus on the development of a lot acceptance sampling plan for a multi-stage process based on time-truncated tests when the lifetime of a product follows a Weibull distribution. We will consider a plan when a single item is installed on a single tester (ordinary sampling plan) and another plan when multiple number of items can be installed on a single tester (group sampling plan). We will determine the plan parameters of the proposed sampling plans using the nonlinear optimization solution so as to minimize the average sample number. The tables are presented and explained with the help of an industrial example.