Application of the attenuated-total-reflection technique to the measurement of silica-gel particle size

摘要

Attenuated-total-reflection (ATR) spectra of thinly deposited silica-gel particles measuring several microns in diameter were measured. The band intensity increased monotonously with decreasing the particle diameter as expected from the characteristic of the evanescent wave. The silica-gel particle size was proved to be determined by use of the ATR technique. [References: 7]