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首页> 外文期刊>The European physical journal, B. Condensed matter physics >Electron mobility in wurtzite nitride quantum wells limited by optical-phonons and its pressure effect
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Electron mobility in wurtzite nitride quantum wells limited by optical-phonons and its pressure effect

机译:声子限制的纤锌矿氮化物量子阱中的电子迁移率及其压力效应

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摘要

Based on the dielectric continuum phonon model, uniaxial model and force balance equation the mobility of two dimensional electron gas in wurtzite AlxGa1-xN/GaN/AlxGa1-xN quantum wells is discussed theoretically within the temperature range dominated by optical phonons. The dependences of the electron mobility on temperature, Al molar fraction and electron sheet density are presented including hydrostatic pressure effect. The built-in electric field is also taken into account. It is found that under normal pressure the main contribution to the mobility is from the scattering of interface optical phonons in narrow (for well width d < 12 -A) and wide (for d > 117 -A and d > 65 -A for finitely thick barriers and infinitely thick ones, respectively) wells, whereas that is from the scattering of confined optical phonons in a well with an intermediate width. It is shown that the electron mobility decreases with increasing Al molar fraction and temperature, whereas increases obviously with increasing electron sheet density. The theoretical calculated electron mobility is 978 cm2/V s which is higher than an available experimental data 875 cm2/V s when x equals to 0.58 at room temperature. The results under hydrostatic pressure considering the modification of strain indicate that the mobility increases slightly as hydrostatic pressure increases from 0 to 10 GPa.
机译:基于介电连续性声子模型,单轴模型和力平衡方程,从理论上讨论了在光学声子占主导的温度范围内二维纤锌矿型AlxGa1-xN / GaN / AlxGa1-xN量子阱中电子气的迁移率。给出了电子迁移率对温度,Al摩尔分数和电子片密度的依赖性,包括静水压力效应。还考虑了内置电场。发现在常压下,对迁移率的主要贡献来自于界面光子在窄(对于孔宽度d <12 -A)和宽(对于d> 117 -A和d> 65 -A有限)的散射。厚的势垒和无限厚的势垒)井,而这是由于受限光子在具有中等宽度的井中的散射所致。结果表明,电子迁移率随Al摩尔分数和温度的升高而降低,而随电子片密度的增加而明显增加。理论计算的电子迁移率是978 cm2 / V s,高于x在室温下等于0.58时可用的实验数据875 cm2 / V s。考虑到应变变化的静水压力下的结果表明,随着静水压力从0 GPa增加到10 GPa,迁移率略有增加。

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