首页> 外文期刊>The European physical journal, B. Condensed matter physics >Charge stripe glasses in La2-xSrxNiO4 for 0.20 < x < 0.25
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Charge stripe glasses in La2-xSrxNiO4 for 0.20 < x < 0.25

机译:在La2-xSrxNiO4中为0.20

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摘要

We present high resolution X-ray measurements characterising the charge stripe order state in the La2-xSrxNiO4 system with x = 0.20, 0.225 and 0.25. We find that in the x = 0.20, 0.225 and 0.25 systems the charge stripe order exists in a charge stripe glass characterised by weak, poorly correlated incommensurate charge stripes in contrast to the strong well correlated charge stripes in the commensurate x = 1/3 system. No stabilisation of the charge order was observed at the next possible commensurate value of epsilon = 0.25. A comparison with high energy X-ray measurements suggested that the charge order may exist in a charge stripe glass in the bulk in the doping region x = 0.20-0.33. Finally at low temperature there was an initial increase in the intensity and correlation not observed with neutron measurements and it appears to be an effect that X-rays are sensitive to but neutrons are not.
机译:我们提供高分辨率X射线测量结果,表征La2-xSrxNiO4系统中x = 0.20、0.225和0.25的电荷条带状状态。我们发现在x = 0.20、0.225和0.25系统中,电荷条带顺序存在于电荷条带玻璃中,其特征是弱的,相关性不强的不相称电荷条带,而相称的x = 1/3系统中的强相关性很强。在下一个可能的ε= 0.25时,未观察到充电顺序的稳定。与高能X射线测量结果的比较表明,在掺杂区域x = 0.20-0.33中,电荷条纹可能存在于块状电荷玻璃中。最终,在低温下,强度和相关性开始出现中子测量未发现的初始增加,这似乎是X射线对敏感但中子不敏感的影响。

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