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Dielectric mismatch and central-cell corrections in doped silicon nanodots

机译:掺杂的硅纳米点的介电失配和中心单元校正

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摘要

The effect of the central-cell corrections on the shallow donor states in Si spherical quantum dot is studied within the effective mass approximation. Finite step-like spatial confining potential, Coulomb and image charge potentials arising from the dielectric mismatch at the interface of the media are taken into account. We found that it is possible to tune the impurity energies by varying the dot radius and dielectric constant of the barrier material. In the strong confinement regime, due to the enhanced weight of the donor wave functions on the impurity atoms, large values of the chemical shifts for typical donors in Si compared to the ones in bulk are obtained. The calculated size-dependence of the effective Bohr radius in donor doped nanocrystals is in reasonable accord with electron spin resonance measurements on Si quantum dots embedded in insulating glass matrices. We conclude that both the dielectric mismatch and central-cell corrections must be considered in the study of these systems in order to obtain satisfactory agreement with experimental data.
机译:在有效质量近似范围内,研究了中心单元校正对Si球形量子点中浅施主态的影响。考虑了由介质界面处的介电失配引起的有限的阶梯状空间限制电位,库仑和图像电荷电位。我们发现可以通过改变阻挡材料的点半径和介电常数来调谐杂质能量。在强约束条件下,由于施主波函数在杂质原子上的权重增加,与块状硅相比,Si中典型施主的化学位移值较大。供体掺杂的纳米晶体中有效玻尔半径的尺寸相关性与嵌入绝缘玻璃基体中的Si量子点上的电子自旋共振测量值合理地吻合。我们得出结论,在这些系统的研究中必须同时考虑介电失配和中心单元校正,以便与实验数据获得令人满意的一致性。

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