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Microwave Dielectric Losses Based on Polarities

机译:基于极性的微波介电损耗

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Microwave dielectrics have been researched up to present, and many compounds with excellent properties are presented, which are listed in a book "Dielectric Material for Wireless Communication" written by Sebastian (2008). These materials are expected for usage of millimetrewave applications and new applications as paraelectrics, so origins of losses for microwave dielectrics are resumed based on the polars produced by impurities, defects, grain boundary, and stress originated from fluctuation of lattice constants. For new applications, the materials with low losses should be redesigned.
机译:迄今为止,已经对微波电介质进行了研究,并提出了许多具有优异性能的化合物,这些化合物列在塞巴斯蒂安(2008)撰写的《无线通信用介电材料》一书中。这些材料有望用于毫米波应用以及作为顺电应用的新应用,因此,微波电介质的损耗起因是基于杂质,缺陷,晶界和晶格常数波动所产生的极性而恢复的。对于新的应用,应重新设计低损耗的材料。

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