Characterization of organic thin films with resonant soft X-ray scattering and reflectivity near the carbon and fluorine absorption edges

摘要

The use of soft X-rays near the carbon absorption edge (270-300 eV) for small angle X-ray scattering and X-ray reflectiv-ity experiments has significantly expanded the scientific capabilities to investigate thin films of soft matter that are primarily composed of carbon and low Z heteroatoms. In this perspective, we will delineate the basic operating principles and underlying physics of these meth-ods and exemplify their impact by discussing a few recent applications. An extension of these methods to the fluorine edge is also included, demonstrating that the general concepts are also applicable to absorp-tion edges of hetero atoms in soft matter. A short perspective of some future developments is provided.